Vol.9, No.2, May 2020. ISSN: 2217-8309 eISSN: 2217-8333
TEM Journal
TECHNOLOGY, EDUCATION, MANAGEMENT, INFORMATICS Association for Information Communication Technology Education and Science |
Extreme Approach to Optimizing the Process of Electrical Discharge Profiling of Diamond Tool
Olga V. Ermilina, Vladimir B. Chemodanov
© 2020 Vladimir B. Chemodanov, published by UIKTEN. This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License. (CC BY-NC-ND 4.0)
Citation Information: TEM Journal. Volume 9, Issue 2, Pages 527-540, ISSN 2217-8309, DOI: 10.18421/TEM92-14, May 2020.
Received: 28 February 2020. Revised: 01 April 2020.
Abstract:
The process of electrical discharge profiling of diamond tool is regarded as a stochastic control object from the point of view of the analysis of factors affecting its productivity. The selection of optimal modes can significantly improve the quality indicators of this process. For this improvement, a model of electrical discharge profiling is developed using the example of diamond grinding wheels, which allows making an informed selection of optimal control modes for this process. The main factor that reduces productivity is the insufficient average power released in the interelectrode gap during electrical discharge machining of the workpiece. The dependence of the indicated power on the size of the interelectrode gap and on the frequency and amplitude of technological pulses is extreme, which determines the choice of approach to optimizing the process. To ensure extreme power control, it is proposed to use the Gauss-Seidel coordinate descent method for two parameters: the size of the interelectrode gap and the amplitude of the pulse generator. The search algorithm for the extremum of the static characteristics of the inertial object for each coordinate is performed with the help of the recursive least squares method.
Keywords –extreme control, objective function, electrical discharge profiling, diamond tool, interelectrode gap, static characteristics, phase trajectory. |
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